（He Yuting) Media such as Xinhua News Agency, Guangming Daily, Nanfang Plus, Guangdong Science & Technology News have covered the breakthrough of multi-interface device measurement by GZIST Maofeng Scholar Prof ZHOU Yanzhou and his team in solving “the Industrial Conundrum of the Century”. It is reported that the team used for the first time laser interferometer measurement technology for multi-interface device measurement by utilizing laser wavenumber/wavelength scanning, without “secondary clamping”, making it possible to conduct double-sided or even multi-interface device contour measurement. This technology has been in use by Guangdong Quality Supervision Bureau and enterprises, the results of which have been reported “beyond expectation”.
The team’s research has won the First Prize of 2020 Guangdong Province Science and Technology Innovations and Second Prize of 2019 Guangdong Province Natural Science. In May 2024, the “Off axis laser wavenumber scanning Fizeau interferometer” that the team designed won the Silver Award of the 49th Geneva International Inventions. Prof Zhou indicated that he and his team will promote at full scale the perspective measurement technology in the industry by the Machine Visual Identity Platform that GZIST provides to make contribution to the real economy and industrial upgrading. GZIST has steadfastly explored the mechanism of industry-university-research integration (IURI), incubating with the base of “Renowned Faculty Studio”through the Technology Transfer Office. GZIST will attach great importance to the National Vital Strategy and the industrial development of Guangdong-Hong Kong-Macau Greater Bay Area for innovations, IURI, technology transfer and the Chinese path to modernization.
Award Certificate
Zhou Yanzhou at GZIST Campus
